Parts of IEEE P1500
lCore Test Language (CTL)
l (Worked done in conjunction with the IEEE 1450.6 CTL which is an extension to the IEEE 1450.0 Standard Test Interface Language (STIL))
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lWrapper 
l A thin shell around the core, which defines a standard Core Test Access Point (CTAP)
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lTAM : Test Access Mechanism – no longer part of the IEEE P1500, but it was intended in the beginning. A survey showed that the testing internal of the Core, and the connections to the test access mechanism at chip-level was not in demand from the  companies.
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