lCore Test Language (CTL)
l (Worked done in conjunction with the IEEE 1450.6 CTL which
is an extension to the IEEE 1450.0
Standard Test Interface Language (STIL))
l
lWrapper
l A thin shell around the core, which defines a standard
Core Test Access Point (CTAP)
l
lTAM : Test Access Mechanism – no longer part of the IEEE
P1500, but it was intended in the
beginning. A survey showed that the testing internal of the Core, and the connections to the test
access mechanism at chip-level was not in
demand from the companies.
l