Introduction to IEEE 1149.1
lTest architecture
lProvide access and control to DFT structures
•Internal scan, boundary scan, BIST, Emulation features
lPopular on stand-alone IC’s
•Low pin count, versatile, easy to comply, flexible.
•Only ONE TAP per IC.
lComponents
•TAP Controller, IR (Indicates what test to perform), Data registers (test output data)
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