DTU 02208
02208 Test of Integrated Circuits
Plan for Lectures 22 through 25:
Other testing issues
In these lectures, a few more practical issues of testing are considered
Test application and test equipment
Economic aspects
Lecture 22:
Test systems :
Tester architecture
Purpose:
To discuss test plans and test equipment
Contents:
Purposes of test
Test planning:
Strategic
and
Operational
levels
Test equipment:
Styles
and
Architectures
Literature:
1-12, 427-441
Lecture 23:
Test systems :
Timing formating
Purpose:
To describe the conversion from simulation patterns to test vectors
Contents:
The test program
Tester architectures:
Pin Electronics
Timing formats
Literature:
1-12, 427-441
Lecture 24:
Test economy :
Part 1
Purpose:
To discuss basic economic aspects of test
Contents:
Multiple test stages
Types of costs:
NRE
and
RE
costs
Defect level:
Yield
Multiple test steps
Literature:
477-509
Lecture 25:
Test economy :
Part 2
Purpose:
To present cost models for tradeoff's
Contents:
Hines model
Learning curves
Window of opportunity
model
Literature:
477-509
Associate professor Flemming Stassen,
stassen@imm.dtu.dk
