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02208 Test of Integrated Circuits |
Design for test becomes the issue, whenever test pattern generation is considered too complex or costly. The design for test problem can be formulated in terms of the questions
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F. Stassen
Testability Analysis
in Lecture Notes on Test of Digital Logic
ID, DTU, January 1992, pp 5.1-5.9
(Paper 8: to be downloaded from Campusnet)