02208 Test of Integrated Circuits
Plan for Lecture 8 through 9:
Test Evaluation
The testing problem can be formulated in terms of 3 questions
Which fault model should we select ?
How can we generate a test pattern ?
How do we measure the test quality ?
The lectures on test evaluation address the last of these questions.
Lecture 8:
Test evaluation :
Fault simulation
Purpose:
To discuss how to estimate Test Quality
Contents:
Defect Level and Fault coverage Serial and Parallel fault simulation
Literature:
M. Abramovici, M.A. Breuer and A.D. Friedman Fault Simulation in Digital Systems Testing and Testable Design
Computer Science Press, 1992, pp 131-172, Chapter 5
(Paper 5: to be downloaded from Campusnet)
Lecture 9:
Test evaluation :
Fault simulation (2)
Purpose:
To present various fault simulation techniques
Contents:
Deductive and Concurrent fault simulation Differential fault simulation and
Single-fault propagation Parallel-value list method
Statistical approaches:
Fault sampling and Statistical fault analysis
Approximative approaches: Critical Path Tracing
Literature:
M. Abramovici, M.A. Breuer and A.D. Friedman Fault Simulation in Digital Systems Testing and Testable Design
Computer Science Press, 1992, pp 131-172, Chapter 5
(Paper 5: to be downloaded from Campusnet)
Associate professor Flemming Stassen,
stassen@imm.dtu.dk
