DTU 02208

Course Description

02208 Test of Integrated Circuits
Plan for Lecture 5 through 7:
Test Pattern Generation



The testing problem can be formulated in terms of 3 questions
  • Which fault model should we select ?
  • How can we generate a test pattern ?
  • How do we measure the test quality ?
The lectures discuss the generation of test patterns.



Lecture 5: Test pattern generation : Boolean differences

Purpose: To present simplistic methods for test pattern generation
Contents:
Functional test patterns
Exhaustive and pseudo-exhaustive test patterns
Random and pseudo-random test pattern generation
Symbolic nethods: Boolean differences
Literature:
Chapter 3

Lecture 6: Test pattern generation : The D-algorithm

Purpose: To discuss algorithmic TPG methods
Contents:
Automated TPG: the problem
D-notation
Gate-level D-algorithm: Excitation, Propagation, Consistency, Backup
Exhaustive search strategies: Depth-first or Width-first?
Switch-level D-algorithm
Literature:
Chapter 3

Lecture 7: Test pattern generation : PODEM and FAN algorithms

Purpose: To discuss improvements of the D-algorithm
Contents:
PODEM: Path-Oriented Decision Making
FAN: Fanout-oriented test pattern generation
Automatic test pattern generation
Sequential test pattern generation
Literature:
Chapter 3

F. Stassen Test Pattern Generation
in Lecture Notes on Test of Digital Logic
ID, DTU, January 1992, pp 3.9-3.19
(Paper 2: to be downloaded from Campusnet)

Associate professor Flemming Stassen, stassen@imm.dtu.dk