02208 Test of Integrated Circuits
Plan for Lectures 2 through 4:
Fault Modeling
The testing problem can be formulated in terms of 3 questions
Which fault model should we select ?
How can we generate a test pattern ?
How do we measure the test quality ?
The lectures on fault modeling address the first of these questions.
Lecture 2:
Fault Modeling :
Physical faults
Purpose: To discuss the need for fault models of physical failures.
Contents:
Test as a distinguishing experiment
Exhaustive testing
Physical failures in ICs
The stuck-at fault model
Literature:
Chapter 2
Lecture 3:
Fault Modeling :
Fault models
Purpose:
To present various fault models and problems of using them.
Contents:
Fault collapsing
Stuck-at fault model: Multiple faults
Untestable and undetectable faults
Bridging faults and transistor faults
How many fault models do we need?
Inductive fault analysis
Statistical process evaluation
External requirements
Literature:
J.P. Shen, W. Maly, F. Joel Ferguson Inductive Fault Analysis of MOS IC's
IEEE D&T of Computers,
Vol. 2/12, pp 13-26, December 1985
(Paper 1: to be downloaded from Campusnet)
Associate professor Flemming Stassen,
stassen@imm.dtu.dk
