Graduate School in Nonlinear Science

Sponsored by The Danish Research Agency




MIDIT                              OFD                          CATS
Modelling, Nonlinear Dynamics      Optics and Fluid Dynamics    Chaos and Turbulence Studies
and Irreversible Thermodynamics    Risø National Laboratory     Niels Bohr Institute and 
Technical University of Denmark    Building 128                 Department of Chemistry
Building 321                       P.O. Box 49                  University of Copenhagen 
DK-2800 Lyngby                     DK-4000 Roskilde             DK-2100 Copenhagen Ø
Denmark                            Denmark                      Denmark



STUDY OF SUPERCONDUCTING MICROWAVE DEVICES BY LOW-TEMPERATURE LASER SCANNING
MICROSCOPY: TECHNICAL AND FUNDAMENTAL ASPECTS

by Professor Alexander Zhuravel
Superconducting Electronics & Mesoscopic Systems
B. Verkin Institute for Low Temperature Physics,
National Academy of Sciences of Ukraine,
Kharkov, Ukraine,

MIDIT-seminar 489


Tuesday, May 22, 2001, 14.00 h
at IMM, Bldg. 305, Room 018, DTU



Abstract: The basic bottleneck for practical use of superconducting microwave devices is their relatively large and inhomogeneous surface impedance and nonlinear power dependence, even at modest power levels. This behavior is due, in part, to inhomogeneous current flow across thin superconducting films. The conventional methods of analyzing the nonlinear response are based on global characteristics of the device such as intermodulation and generation of har monics. This kind of analysis does not directly lead to a solution of this problem, i.e. to finding the origin of the observed nonlinearity. We devised a general experimental procedure for imaging the microwave current distributions which are caused by superconducting order parameter variations in operating devices. A new generation of Low-Temperature Laser Scanning Microscopy is developed to investigate the local origins of the nonlinearity in superconduct ing microwave devices.